| Characterisation of Ti1− xSixNy nanocomposite films F Vaz, L Rebouta, P Goudeau, J Pacaud, H Garem, JP Riviere, ... Surface and Coatings Technology 133, 307-313, 2000 | 239 | 2000 |
| Structural, optical and mechanical properties of coloured TiNxOy thin films F Vaz, P Cerqueira, L Rebouta, SMC Nascimento, E Alves, P Goudeau, ... Thin Solid Films 447, 449-454, 2004 | 235 | 2004 |
| Influence of nitrogen content on the structural, mechanical and electrical properties of TiN thin films F Vaz, J Ferreira, E Ribeiro, L Rebouta, S Lanceros-Méndez, JA Mendes, ... Surface and Coatings Technology 191 (2-3), 317-323, 2005 | 214 | 2005 |
| Improvement of the tribological behaviour of PVD nanostratified TiN/CrN coatings—An explanation C Mendibide, P Steyer, J Fontaine, P Goudeau Surface and Coatings Technology 201 (7), 4119-4124, 2006 | 125 | 2006 |
| Structural transitions in hard Si-based TiN coatings: the effect of bias voltage and temperature F Vaz, L Rebouta, P Goudeau, T Girardeau, J Pacaud, JP Riviere, ... Surface and Coatings Technology 146, 274-279, 2001 | 124 | 2001 |
| Atomistic calculation of size effects on elastic coefficients in nanometre-sized tungsten layers and wires P Villain, P Beauchamp, KF Badawi, P Goudeau, PO Renault Scripta materialia 50 (9), 1247-1251, 2004 | 118 | 2004 |
| Structural analysis of Ti1− xSixNy nanocomposite films prepared by reactive magnetron sputtering F Vaz, L Rebouta, B Almeida, P Goudeau, J Pacaud, JP Riviere, ... Surface and Coatings Technology 120, 166-172, 1999 | 111 | 1999 |
| Structural, electrical, optical, and mechanical characterizations of decorative ZrOxNy thin films P Carvalho, F Vaz, L Rebouta, L Cunha, CJ Tavares, C Moura, E Alves, ... Journal of applied physics 98 (2), 2005 | 105 | 2005 |
| Size effect on intragranular elastic constants in thin tungsten films P Villain, P Goudeau, PO Renault, KF Badawi Applied physics letters 81 (23), 4365-4367, 2002 | 103 | 2002 |
| Residual stress states in sputtered Ti1− xSixNy films F Vaz, L Rebouta, P Goudeau, JP Riviere, E Schäffer, G Kleer, ... Thin Solid Films 402 (1-2), 195-202, 2002 | 97 | 2002 |
| Young modulus and Poisson ratio measurements of TiO2 thin films deposited with Atomic Layer Deposition L Borgese, M Gelfi, E Bontempi, P Goudeau, G Geandier, D Thiaudière, ... Surface and Coatings Technology 206 (8-9), 2459-2463, 2012 | 96 | 2012 |
| Property change in ZrNxOy thin films: effect of the oxygen fraction and bias voltage F Vaz, P Carvalho, L Cunha, L Rebouta, C Moura, E Alves, AR Ramos, ... Thin Solid Films 469, 11-17, 2004 | 89 | 2004 |
| Measuring thin film and multilayer elastic constants by coupling in situ tensile testing with x-ray diffraction KF Badawi, P Villain, P Goudeau, PO Renault Applied Physics Letters 80 (25), 4705-4707, 2002 | 89 | 2002 |
| New apparatus for grazing X-ray reflectometry in the angle-resolved dispersive mode A Naudon, J Chihab, P Goudeau, J Mimault Journal of applied crystallography 22 (5), 460-464, 1989 | 89 | 1989 |
| Study of texture effect on elastic properties of Au thin films by X-ray diffraction and in situ tensile testing D Faurie, PO Renault, E Le Bourhis, P Goudeau Acta Materialia 54 (17), 4503-4513, 2006 | 88 | 2006 |
| Preparation of magnetron sputtered TiNxOy thin films F Vaz, P Cerqueira, L Rebouta, SMC Nascimento, E Alves, P Goudeau, ... Surface and Coatings Technology 174, 197-203, 2003 | 81 | 2003 |
| Poisson’s ratio measurement in tungsten thin films combining an x-ray diffractometer with in situ tensile tester PO Renault, KF Badawi, L Bimbault, P Goudeau, E Elkaım, JP Lauriat Applied physics letters 73 (14), 1952-1954, 1998 | 81 | 1998 |
| Influence of the nanostructuration of PVD hard TiN-based films on the durability of coated steel P Steyer, A Mege, D Pech, C Mendibide, J Fontaine, JF Pierson, C Esnouf, ... Surface and Coatings Technology 202 (11), 2268-2277, 2008 | 78 | 2008 |
| Atomic force microscopy of in situ deformed nickel thin films C Coupeau, JF Naud, F Cleymand, P Goudeau, J Grilhé Thin Solid Films 353 (1-2), 194-200, 1999 | 78 | 1999 |
| Characterization of photoluminescent porous Si by small‐angle scattering of X rays V Vezin, P Goudeau, A Naudon, A Halimaoui, G Bomchil Applied physics letters 60 (21), 2625-2627, 1992 | 77 | 1992 |
Pierre-Olivier Renaultuniversité de PoitiersVerified email at univ-poitiers.fr
