| Focusing of a neutral helium beam below one micron SD Eder, T Reisinger, MM Greve, G Bracco, B Holst New Journal of Physics 14 (7), 073014, 2012 | 52 | 2012 |
| Finite-size limitations on quality factor of guided resonance modes in 2D photonic crystals JO Grepstad, MM Greve, B Holst, IR Johansen, O Solgaard, A Sudbø Optics express 21 (20), 23640-23654, 2013 | 41 | 2013 |
| Free-standing silicon-nitride zoneplates for neutral-helium microscopy T Reisinger, S Eder, MM Greve, HI Smith, B Holst Microelectronic engineering 87 (5-8), 1011-1014, 2010 | 39 | 2010 |
| Optimization of an electron beam lithography instrument for fast, large area writing at 10 kV acceleration voltage MM Greve, B Holst Journal of Vacuum Science & Technology B 31 (4), 2013 | 35 | 2013 |
| Focusing of a neutral helium beam with a photon-sieve structure SD Eder, X Guo, T Kaltenbacher, MM Greve, M Kalläne, L Kipp, B Holst Physical Review A 91 (4), 043608, 2015 | 27 | 2015 |
| A theoretical investigation of the optical properties of metal nanoparticles in water for photo thermal conversion enhancement VRA Holm, MM Greve, B Holst Energy conversion and management 149, 536-542, 2017 | 26 | 2017 |
| The Beynon Gabor zone plate: a new tool for de Broglie matter waves and hard X-rays? An off axis and focus intensity investigation MM Greve, AM Vial, JJ Stamnes, B Holst Optics Express 21 (23), 28483-28495, 2013 | 23 | 2013 |
| Exploring proximity effects and large depth of field in helium ion beam lithography: large-area dense patterns and tilted surface exposure R Flatabø, A Agarwal, R Hobbs, MM Greve, B Holst, KK Berggren Nanotechnology 29 (27), 275301, 2018 | 20 | 2018 |
| Large area microwave plasma CVD of diamond using composite right/left-handed materials J Zalieckas, P Pobedinskas, MM Greve, K Eikehaug, K Haenen, B Holst Diamond and Related Materials 116, 108394, 2021 | 18 | 2021 |
| A systematic investigation of the charging effect in scanning electron microscopy for metal nanostructures on insulating substrates R Flatabø, A Coste, MM Greve Journal of Microscopy 265 (3), 287-297, 2017 | 18 | 2017 |
| Perspectives on weak interactions in complex materials at different length scales J Fiedler, K Berland, JW Borchert, RW Corkery, A Eisfeld, ... Physical Chemistry Chemical Physics 25 (4), 2671-2705, 2023 | 15 | 2023 |
| Brightness and virtual source size of a supersonic deuterium beam T Reisinger, MM Greve, SD Eder, G Bracco, B Holst Physical review a 86 (4), 043804, 2012 | 14 | 2012 |
| Nanostructures and wetting properties controlled by reactive ion etching of fluorinated ethylene propylene N Frøvik, MM Greve, LE Helseth Colloids and Surfaces A: Physicochemical and Engineering Aspects 574, 228-238, 2019 | 13 | 2019 |
| Work function-driven hot electron extraction in a bimetallic plasmonic MIM device VRA Holm, BY Zheng, PM Denby, B Holst, NJ Halas, MM Greve ACS Photonics 5 (4), 1202-1207, 2018 | 11 | 2018 |
| Measuring the localized surface plasmon resonance effect on large arrays (5 mm× 5 mm) of gold and aluminum nanoparticles on borosilicate glass substrates, fabricated by … MM Greve, TO Håvardstun, B Holst Journal of Vacuum Science & Technology B 31 (6), 2013 | 10 | 2013 |
| Polycrystalline diamond coating on orthopedic implants: realization and role of surface topology and chemistry in adsorption of proteins and cell proliferation J Zalieckas, IR Mondragon, P Pobedinskas, AS Kristoffersen, ... ACS Applied Materials & Interfaces 14 (39), 44933-44946, 2022 | 9 | 2022 |
| Light absorption and scattering of 40–170 nm gold nanoparticles on glass substrates R Flatabø, VRA Holm, H Eidsvåg, B Holst, MM Greve Journal of Vacuum Science & Technology B 35 (6), 2017 | 9 | 2017 |
| Atom sieve for nanometer resolution neutral helium microscopy R Flatabø, MM Greve, SD Eder, M Kalläne, AS Palau, KK Berggren, ... Journal of Vacuum Science & Technology B 35 (6), 2017 | 8 | 2017 |
| Nanostructuring of free-standing, dielectric membranes using electron-beam lithography JO Grepstad, MM Greve, T Reisinger, B Holst American Institute of Physics, 2013 | 8 | 2013 |
| Fast resolution change in neutral helium atom microscopy R Flatabø, SD Eder, AK Ravn, B Samelin, MM Greve, T Reisinger, B Holst Review of Scientific Instruments 89 (5), 2018 | 7 | 2018 |
