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Eric Gullikson
Eric Gullikson
Verified email at lbl.gov
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Cited by
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X-ray interactions: photoabsorption, scattering, transmission, and reflection at E= 50-30,000 eV, Z= 1-92
BL Henke, EM Gullikson, JC Davis
Atomic data and nuclear data tables 54 (2), 181-342, 1993
76491993
Single-cycle nonlinear optics
E Goulielmakis, M Schultze, M Hofstetter, VS Yakovlev, J Gagnon, ...
Science 320 (5883), 1614-1617, 2008
19942008
Coherent soft x-ray generation in the water window with quasi-phase matching
EA Gibson, A Paul, N Wagner, R Tobey, D Gaudiosi, S Backus, ...
Science 302 (5642), 95-98, 2003
4772003
Initial Calibration of the Atmospheric Imaging Assembly (AIA) on the Solar Dynamics Observatory (SDO)
P Boerner, C Edwards, J Lemen, A Rausch, C Schrijver, R Shine, L Shing, ...
The Solar Dynamics Observatory, 41-66, 2012
4752012
Solid neon moderator for producing slow positrons
AP Mills Jr, EM Gullikson
Applied Physics Letters 49 (17), 1121-1123, 1986
3821986
Attosecond metrology
BL Henke, EM Gullikson, JC Davis
Atomic Data and Nuclear Data Tales 54, 181-342, 1993
2391993
Nonspecular x-ray scattering in a multilayer-coated imaging system
DG Stearns, DP Gaines, DW Sweeney, EM Gullikson
Journal of Applied Physics 84 (2), 1003-1028, 1998
2091998
Stable silicon photodiodes for absolute intensity measurements in the VUV and soft x-ray regions
EM Gullikson, R Korde, LR Canfield, RE Vest
Journal of Electron Spectroscopy and Related Phenomena 80, 313-316, 1996
2041996
Recent developments in EUV reflectometry at the Advanced Light Source
EM Gullikson, S Mrowka, BB Kaufmann
Emerging Lithographic Technologies V 4343, 363-373, 2001
1772001
High-resolution, high-flux, user friendly VLS beamline at the ALS for the 50–1300 eV energy region
JH Underwood, EM Gullikson
Journal of electron spectroscopy and related phenomena 92 (1-3), 265-272, 1998
1771998
Calibration and standards beamline 6.3. 2 at the Advanced Light Source
JH Underwood, EM Gullikson, M Koike, PJ Batson, PE Denham, ...
Review of Scientific Instruments 67 (9), 3372-3372, 1996
1771996
Electronic states in valence and conduction bands of group-III nitrides: Experiment and theory
K Lawniczak-Jablonska, T Suski, I Gorczyca, NE Christensen, ...
Physical Review B 61 (24), 16623, 2000
1722000
Positron dynamics in rare-gas solids
EM Gullikson, AP Mills Jr
Physical review letters 57 (3), 376, 1986
1521986
A soft x-ray/EUV reflectometer based on a laser produced plasma source
EM Gullikson, JH Underwood, PC Batson, V Nikitin
Journal of X-ray Science and Technology 3 (4), 283-299, 1992
1421992
Simultaneous ESR and Magnetization Measurements Characterizing theSpin-Glass State
S Schultz, EM Gullikson, DR Fredkin, M Tovar
Physical Review Letters 45 (18), 1508, 1980
1401980
Molybdenum/beryllium multilayer mirrors for normal incidence in the extreme ultraviolet
KM Skulina, CS Alford, RM Bionta, DM Makowiecki, EM Gullikson, ...
Applied Optics 34 (19), 3727-3730, 1995
1381995
Reflectance measurements on clean surfaces for the determination of optical constants of silicon in the extreme ultraviolet–soft-x-ray region
R Soufli, EM Gullikson
Applied Optics 36 (22), 5499-5507, 1997
1221997
Aqueous solution/metal interfaces investigated in operando by photoelectron spectroscopy
O Karslıoğlu, S Nemšák, I Zegkinoglou, A Shavorskiy, M Hartl, F Salmassi, ...
Faraday discussions 180, 35-53, 2015
1192015
Practical approach for modeling extreme ultraviolet lithography mask defects
EM Gullikson, C Cerjan, DG Stearns, PB Mirkarimi, DW Sweeney
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2002
1182002
Concentration and chemical-state profiles at heterogeneous interfaces with sub-nm accuracy from standing-wave ambient-pressure photoemission
S Nemšák, A Shavorskiy, O Karslioglu, I Zegkinoglou, A Rattanachata, ...
Nature Communications 5 (1), 5441, 2014
1162014
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