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s y tong
s y tong
The Chinese University of Hong Kong, Shenzhen
Verified email at cuhk.edu.cn
Title
Cited by
Cited by
Year
Small-diameter silicon nanowire surfaces
DDD Ma, CS Lee, FCK Au, SY Tong, ST Lee
Science 299 (5614), 1874-1877, 2003
14412003
Surface crystallography by LEED: theory, computation and structural results
MA Van Hove, SY Tong
Springer Science & Business Media, 2012
10542012
Stress and its effect on optical properties of GaN epilayers grown on Si(111), 6H-SiC(0001), and c-plane sapphire
DG Zhao, SJ Xu, MH Xie, SY Tong, H Yang
Applied physics letters 83 (4), 677-679, 2003
4622003
Surface structure refinements of 2H MoS2, 2H NbSe2 and W (100) p (2 1) O via new reliability factors for surface crystallography
MA Van Hove, SY Tong, MH Elconin
Surface Science 64 (1), 85-95, 1977
2501977
Low‐energy electron diffraction analysis of the Si (111) 7 7 structure
SY Tong, H Huang, CM Wei, WE Packard, FK Men, G Glander, MB Webb
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 6 (3…, 1988
2491988
Vacancy-buckling model for the (2 2) GaAs (111) surface
SY Tong, G Xu, WN Mei
Physical review letters 52 (19), 1693, 1984
2391984
Focusing and diffraction effects in angle-resolved x-ray photoelectron spectroscopy
HC Poon, SY Tong
Physical Review B 30 (10), 6211, 1984
2301984
Chemisorption bond lengths of chalcogen overlayers at a low coverage by convergent perturbation methods
M Van Hove, SY Tong
Journal of Vacuum Science and Technology 12 (1), 230-233, 1975
2161975
Anisotropic step-flow growth and island growth of GaN (0001) by molecular beam epitaxy
MH Xie, SM Seutter, WK Zhu, LX Zheng, H Wu, SY Tong
Physical review letters 82 (13), 2749, 1999
2101999
Importance of multiple forward scattering in medium-and high-energy electron emission and/or diffraction spectroscopies
SY Tong, HC Poon, DR Snider
Physical Review B 32 (4), 2096, 1985
2101985
Surface bond angle and bond lengths of rearranged As and Ga atoms on GaAs (110)
SY Tong, AR Lubinsky, BJ Mrstik, MA Van Hove
Physical Review B 17 (8), 3303, 1978
2091978
Thermal redistribution of localized excitons and its effect on the luminescence band in InGaN ternary alloys
Q Li, SJ Xu, WC Cheng, MH Xie, SY Tong, CM Che, H Yang
Applied Physics Letters 79 (12), 1810-1812, 2001
1872001
Energy extension in three-dimensional atomic imaging by electron emission holography
SY Tong, H Li, H Huang
Physical review letters 67 (22), 3102, 1991
1671991
Inelastic scattering of electrons from adsorbate vibrations: Large-angle deflections
SY Tong, CH Li, DL Mills
Physical Review Letters 44 (6), 407, 1980
1571980
Large-angle inelastic electron scattering from adsorbate vibrations: Basic theory
CH Li, SY Tong, DL Mills
Physical Review B 21 (8), 3057, 1980
1551980
Structures and energetics of hydrogen-terminated silicon nanowire surfaces
RQ Zhang, Y Lifshitz, DDD Ma, YL Zhao, T Frauenheim, ST Lee, SY Tong
The Journal of Chemical Physics 123 (14), 2005
1432005
Phase-shift correction in three-dimensional imaging using foward-scattering photoemission and Auger spectoscopies
SY Tong, CM Wei, TC Zhao, H Huang, H Li
Physical review letters 66 (1), 60, 1991
1391991
Method for spatially resolved imaging of energy-dependent photoelectron diffraction
SY Tong, H Huang, CM Wei
Physical Review B 46 (4), 2452, 1992
1341992
A model for steady-state luminescence of localized-state ensemble
Q Li, SJ Xu, MH Xie, SY Tong
Europhysics Letters 71 (6), 994, 2005
1302005
Growth mode and strain evolution during InN growth on GaN (0001) by molecular-beam epitaxy
YF Ng, YG Cao, MH Xie, XL Wang, SY Tong
Applied physics letters 81 (21), 3960-3962, 2002
1282002
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