Zhuohui Zeng
Cited by
Cited by
Axial crushing of pressurized cylindrical tubes
LL Hu, ZH Zeng, TX Yu
International Journal of Mechanical Sciences 107, 126-135, 2016
Two-tier compatibility of superelastic bicrystal micropillar at grain boundary
M Karami, Z Zhu, Z Zeng, N Tamura, Y Yang, X Chen
Nano letters 20 (11), 8332-8338, 2020
Impact of leakage for electricity generation by pyroelectric converter
C Zhang, Z Zeng, Z Zhu, M Karami, X Chen
Physical Review Applied 14 (6), 064079, 2020
Dual beam-shear differential interference microscopy for full-field surface deformation gradient characterization
Z Zeng, HC Chiu, L Zhao, T Zhao, C Zhang, M Karami, H Yu, S Du, ...
Journal of the Mechanics and Physics of Solids 145, 104162, 2020
Quantitative surface topography of martensitic microstructure by differential interference contrast microscopy
Z Zeng, C Zhang, S Du, X Chen
Journal of the Mechanics and Physics of Solids 124, 102-114, 2019
Measuring optical beam shear angle of polarizing prisms beyond the diffraction limit with localization method
HC Chiu, Z Zeng, L Zhao, T Zhao, S Du, X Chen
Optics Communications 435, 227-231, 2019
Energy conversion from heat to electricity by highly reversible phase-transforming ferroelectrics
C Zhang, Z Zeng, Z Zhu, N Tamura, X Chen
Physical Review Applied 16 (2), 024064, 2021
In situ characterization of buckling dynamics in silicon microribbon on an elastomer substrate
Z Zeng, H Yu, X Chen
Extreme Mechanics Letters 48, 101397, 2021
In situ thermal-microstructure characterization of a phase-transforming alloy satisfying cofactor conditions
Z Zeng, X Chen
Scripta Materialia 218, 114831, 2022
Giant pyroelectric effect for energy conversion via tuning lattice compatibility
C Zhang, Z Zeng, Z Zhu, N Tamura, X Chen
arXiv preprint arXiv:2105.07201, 2021
Development and Applications of Differential Interference Microscopy for Quantitative Surface Topography Evolution Study on Martensitic Transformation and Thin Film Buckling
Z Zeng
PQDT-Global, 2021
Precise characterization of polarizing prisms by optical localization analysis
HC Chiu, Z Zeng, L Zhao, T Zhao, S Du, X Chen
arXiv preprint arXiv:1810.04271, 2018
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