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Hoon SongSamsung Advanced Institute of TechnologyVerified email at samsung.com
Jungkwuen AnSamsung ResearchVerified email at samsung.com
Kim Sun IlSamsung Advanced Institute of TechnologyVerified email at samsung.com
Byoungho LeeSeoul National University, Professor of School of Electrical and Computer EngineeringVerified email at snu.ac.kr
Chil-Sung ChoiSamsung Advanced Institute of TechnologyVerified email at samsung.com
Alexander V MorozovSamsung R&D Intitute RusVerified email at rosatom.ru
Yunhee KimSamsung electronicsVerified email at samsung.com
Moon Gyu HanPrincipal Research Scientist, Samsung Advanced Institute of Technology, Samsung ElectronicsVerified email at samsung.com
Sungwoo HwangSamsung Advanced Institute of TechnologyVerified email at samsung.com
Seok Ho SongHanyang UniversityVerified email at hanyang.ac.kr
Jun-Bo YoonDepartment of Electrical Engineering, KAISTVerified email at ee.kaist.ac.kr
Sergey E DubyninФизический институт имени П. Н. Лебедева Российской академии наукVerified email at lebedev.ru
Jae-Hyeung ParkDepartment of Electrical and Computer Engineering, Seoul National UniversityVerified email at snu.ac.kr
Vladislav V. DruzhinBauman MSTUVerified email at bmstu.ru
Hwi KimProfessor of Electronics and Information Engineering, Korea UniversityVerified email at korea.ac.kr
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Hong-Seok Lee
Associate Professor of Electrical Engineering, Pukyong National University
Verified email at pknu.ac.kr