| Valley anisotropy in elastic metamaterials S Li, I Kim, S Iwamoto, J Zang, J Yang Physical Review B 100 (19), 195102, 2019 | 28 | 2019 |
| Topologically protected elastic waves in one-dimensional phononic crystals of continuous media I Kim, S Iwamoto, Y Arakawa Applied Physics Express 11 (1), 017201, 2017 | 28 | 2017 |
| Design of GaAs-based valley phononic crystals with multiple complete phononic bandgaps at ultra-high frequency I Kim, Y Arakawa, S Iwamoto Applied Physics Express 12 (4), 047001, 2019 | 21 | 2019 |
| Visible upconversion luminescence of doped bulk silicon for a multimodal wafer metrology BI Afinogenov, AN Sofronov, IM Antropov, NR Filatov, AS Medvedev, ... Optics Letters 46 (13), 3071-3074, 2021 | 3 | 2021 |
| High-speed wafer magnetic field inspection for semiconductor manufacturing S Ueyama, J Kim, M Numata, W Kim, I Kim, M Lee Metrology, Inspection, and Process Control XXXVI 12053, 142-150, 2022 | 2 | 2022 |
| Enhanced photoelastic modulation in silica phononic crystal cavities I Kim, S Iwamoto, Y Arakawa Japanese Journal of Applied Physics 57 (4), 042002, 2018 | 1 | 2018 |
| Design of quasi-one-dimensional phononic crystal cavity for efficient photoelastic modulation I Kim, S Iwamoto, Y Arakawa Japanese Journal of Applied Physics 55 (8S3), 08RD02, 2016 | 1 | 2016 |
| Substrate inspection system and method of manufacturing semiconductor device using substrate inspection system E Jeang, B Afinogenov, S Bae, W Joo, M Riabko, A Medvedev, ... US Patent App. 18/495,618, 2024 | | 2024 |
| Method of extracting properties of a layer on a wafer B Inkeun, P Suhwan, I Jeon, N Koo, KIM Ingi, J Kim, J Park, JUN Sunhong US Patent App. 18/202,650, 2024 | | 2024 |
| Non-contact measurement of dopant depth profile with terahertz emission spectroscopy K Suzuki, F Murakami, I Baek, M Numata, I Kim, R Sungyoon, S Ueyama, ... Metrology, Inspection, and Process Control XXXVIII 12955, 12-22, 2024 | | 2024 |
| Polarization measuring device and method of fabricating semiconductor device using the same KIM Ingi, M Seo, S Bae, A Okubo, J Lee, E Jeang US Patent 11,946,809, 2024 | | 2024 |
| Substrate inspection system and method of manufacturing semiconductor device using substrate inspection system E Jeang, B Afinogenov, S Bae, W Joo, M Riabko, A Medvedev, ... US Patent 11,823,961, 2023 | | 2023 |
| Wafer inspection apparatus and system including the same K Han, KIM Ingi, S Bae, J Lee, M Seo, M Ko, YJ Lee, T Kim, S Lee US Patent 11,823,927, 2023 | | 2023 |
| Scanning Magneto-optic Kerr effect microscope for inspection of MRAM manufacturing M Numata, I Kim, K Suzuki, S Ueyama, J Kim, W Kim, M Lee IEEE Transactions on Magnetics, 2023 | | 2023 |
| Characterization of interface charge traps in PE-TEOS and HDP oxide with different annealing temperatures using time-dependent second-harmonic generation I Kim, S Park, M Seo, S Jun, S Ryu, S Bae, N Koo, Y Yang Nonlinear Optics and Applications XIII 12569, 9-12, 2023 | | 2023 |
| Inspection device S Ueyama, KIM Ingi, H Sekiya, T Onishi US Patent App. 18/047,820, 2023 | | 2023 |
| Particle inspection device based on spatial modulation method and particle inspection method using the particle inspection device S Bae, B Afinogenov, M Riabko, A Medvedev, A Shorokhov, A Sofronov, ... US Patent App. 17/215,185, 2022 | | 2022 |
| Visible upconversion photoluminescence of bulk silicon and mesoscale silicon nanoparticles BI Afinogenov, AS Medvedev, IM Antropov, NR Filatov, AN Sofronov, ... Nanoengineering: Fabrication, Properties, Optics, Thin Films, and Devices …, 2020 | | 2020 |
| Single nanoparticle detection in the far field by nonlinear optical method EH Jeang, B Afinogenov, S Bae, TH Kim, I Kim, K Han, A Ohkubo, SM Lee, ... Nonlinear Optics and its Applications 2020 11358, 1135802, 2020 | | 2020 |
| Investigation of on-chip excitation of edge-states in GaAs valley phononic crystals by using interdigital electrodes Z Sun, I Kim, S Iwamoto JSAP Annual Meetings Extended Abstracts The 80th JSAP Autumn Meeting 2019 …, 2019 | | 2019 |
Satoshi IwamotoThe University of TokyoDirección de correo verificada de iis.u-tokyo.ac.jp
