| NBS determination of the fine-structure constant, and of the quantized Hall resistance and Josephson frequency-to-voltage quotient in SI units ME Cage, RF Dziuba, RE Elmquist, BF Field, GR Jones, PT Olsen, ... ieee Transactions on Instrumentation and Measurement 38 (2), 284-289, 1989 | 142 | 1989 |
| Part-per-million quantization and current-induced breakdown of the quantum anomalous Hall effect EJ Fox, IT Rosen, Y Yang, GR Jones, RE Elmquist, X Kou, L Pan, ... Physical Review B 98 (7), 075145, 2018 | 114 | 2018 |
| NIST comparison of the quantized Hall resistance and the realization of the SI ohm through the calculable capacitor AM Jeffery, RE Elmquist, LH Lee, JQ Shields, RF Dziuba IEEE transactions on instrumentation and measurement 46 (2), 264-268, 1997 | 104 | 1997 |
| Determination of the von Klitzing constant and the fine-structure constant through a comparison of the quantized Hall resistance and the ohm derived from the NIST calculable … A Jeffery, RE Elmquist, JQ Shields, LH Lee, ME Cage, SH Shields, ... Metrologia 35 (2), 83, 1998 | 75 | 1998 |
| Low carrier density epitaxial graphene devices on SiC Y Yang, LI Huang, Y Fukuyama, FH Liu, MA Real, P Barbara, CT Liang, ... Small 11 (1), 90-95, 2015 | 74 | 2015 |
| Epitaxial graphene homogeneity and quantum Hall effect in millimeter-scale devices Y Yang, G Cheng, P Mende, IG Calizo, RM Feenstra, C Chuang, CW Liu, ... Carbon 115, 229-236, 2017 | 72 | 2017 |
| Next-generation crossover-free quantum Hall arrays with superconducting interconnections M Kruskopf, AF Rigosi, AR Panna, M Marzano, D Patel, H Jin, DB Newell, ... Metrologia 56 (6), 065002, 2019 | 62 | 2019 |
| The quantum Hall effect in the era of the new SI AF Rigosi, RE Elmquist Semiconductor science and technology 34 (9), 093004, 2019 | 61 | 2019 |
| Two-terminal and multi-terminal designs for next-generation quantized Hall resistance standards: contact material and geometry M Kruskopf, AF Rigosi, AR Panna, DK Patel, H Jin, M Marzano, M Berilla, ... IEEE transactions on electron devices 66 (9), 3973-3977, 2019 | 60 | 2019 |
| A measurement of the NBS electrical watt in SI units PT Olsen, RE Elmquist, WD Phillips, ER Williams, GR Jones, VE Bower ieee Transactions on Instrumentation and Measurement 38 (2), 238-244, 1989 | 58 | 1989 |
| Confocal laser scanning microscopy for rapid optical characterization of graphene V Panchal, Y Yang, G Cheng, J Hu, M Kruskopf, CI Liu, AF Rigosi, ... Communications physics 1 (1), 83, 2018 | 56 | 2018 |
| Epitaxial graphene for quantum resistance metrology M Kruskopf, RE Elmquist Metrologia 55 (4), R27, 2018 | 56 | 2018 |
| Gateless and reversible Carrier density tunability in epitaxial graphene devices functionalized with chromium tricarbonyl AF Rigosi, M Kruskopf, HM Hill, H Jin, BY Wu, PE Johnson, S Zhang, ... Carbon 142, 468-474, 2019 | 54 | 2019 |
| Graphene epitaxial growth on SiC (0001) for resistance standards MA Real, EA Lass, FH Liu, T Shen, GR Jones, JA Soons, DB Newell, ... IEEE Transactions on Instrumentation and Measurement 62 (6), 1454-1460, 2013 | 53 | 2013 |
| Graphene devices for tabletop and high-current quantized Hall resistance standards AF Rigosi, AR Panna, SU Payagala, M Kruskopf, ME Kraft, GR Jones, ... IEEE transactions on instrumentation and measurement 68 (6), 1870-1878, 2018 | 51 | 2018 |
| Quantum Hall effect on centimeter scale chemical vapor deposited graphene films T Shen, W Wu, Q Yu, CA Richter, R Elmquist, D Newell, YP Chen Applied Physics Letters 99 (23), 2011 | 50 | 2011 |
| NIST measurement service for DC standard resistors RE Elmquist, DG Jarrett, GR Jones, ME Kraft, SH Shields, RF Dziuba NIST Technical Note 1458, 75, 2003 | 50 | 2003 |
| Comparison between NIST graphene and AIST GaAs quantized Hall devices T Oe, AF Rigosi, M Kruskopf, BY Wu, HY Lee, Y Yang, RE Elmquist, ... IEEE transactions on instrumentation and measurement 69 (6), 3103-3108, 2019 | 46 | 2019 |
| Towards epitaxial graphene p-n junctions as electrically programmable quantum resistance standards J Hu, AF Rigosi, M Kruskopf, Y Yang, BY Wu, J Tian, AR Panna, HY Lee, ... Scientific reports 8 (1), 15018, 2018 | 45 | 2018 |
| Preservation of surface conductivity and dielectric loss tangent in large‐scale, encapsulated epitaxial graphene measured by noncontact microwave cavity perturbations AF Rigosi, NR Glavin, CI Liu, Y Yang, J Obrzut, HM Hill, J Hu, HY Lee, ... Small 13 (26), 1700452, 2017 | 42 | 2017 |
Albert RigosiNational Institute of Standards and TechnologyVerified email at nist.gov
