| A review of focused ion beam milling techniques for TEM specimen preparation LA Giannuzzi, FA Stevie Micron 30 (3), 197-204, 1999 | 1598 | 1999 |
| Introduction to focused ion beams: instrumentation, theory, techniques and practice LA Giannuzzi Springer Science & Business Media, 2004 | 1588 | 2004 |
| TEM sample preparation and FIB-induced damage J Mayer, LA Giannuzzi, T Kamino, J Michael MRS bulletin 32 (5), 400-407, 2007 | 1096 | 2007 |
| High-temperature interface superconductivity between metallic and insulating copper oxides A Gozar, G Logvenov, LF Kourkoutis, AT Bollinger, LA Giannuzzi, ... Nature 455 (7214), 782-785, 2008 | 652 | 2008 |
| Site-specific 3D imaging of cells and tissues with a dual beam microscope JAW Heymann, M Hayles, I Gestmann, LA Giannuzzi, B Lich, ... Journal of structural biology 155 (1), 63-73, 2006 | 406 | 2006 |
| Applications of the FIB lift‐out technique for TEM specimen preparation LA Giannuzzi, JL Drown, SR Brown, RB Irwin, FA Stevie Microscopy research and technique 41 (4), 285-290, 1998 | 349 | 1998 |
| High strength and high modulus carbon fibers HG Chae, BA Newcomb, PV Gulgunje, Y Liu, KK Gupta, MG Kamath, ... Carbon 93, 81-87, 2015 | 261 | 2015 |
| Focused ion beam milling and micromanipulation lift-out for site specific cross-section TEM specimen preparation LA Giannuzzi, JL Drown, SR Brown, RB Irwin, FA Stevie MRS Online Proceedings Library 480 (1), 19-27, 1997 | 255 | 1997 |
| Focused ion beam milling: A method of site-specific sample extraction for microanalysis of Earth and planetary materials PJ Heaney, EP Vicenzi, LA Giannuzzi, KJT Livi American Mineralogist 86 (9), 1094-1099, 2001 | 237 | 2001 |
| Recent advances in focused ion beam technology and applications N Bassim, K Scott, LA Giannuzzi Mrs Bulletin 39 (4), 317-325, 2014 | 190 | 2014 |
| 2 keV Ga+ FIB milling for reducing amorphous damage in silicon LA Giannuzzi, R Geurts, J Ringnalda Microscopy and Microanalysis 11 (S02), 828-829, 2005 | 157 | 2005 |
| The correlation between ion beam/material interactions and practical FIB specimen preparation BI Prenitzer, CA Urbanik-Shannon, LA Giannuzzi, SR Brown, RB Irwin, ... Microscopy and Microanalysis 9 (3), 216-236, 2003 | 143 | 2003 |
| Application of focused ion beam lift‐out specimen preparation to TEM, SEM, STEM, AES and SIMS analysis FA Stevie, CB Vartuli, LA Giannuzzi, TL Shofner, SR Brown, B Rossie, ... Surface and Interface Analysis: An International Journal devoted to the …, 2001 | 139 | 2001 |
| Ion channeling effects on the focused ion beam milling of Cu BW Kempshall, SM Schwarz, BI Prenitzer, LA Giannuzzi, RB Irwin, ... Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2001 | 136 | 2001 |
| FIB lift-out specimen preparation techniques: ex-situ and in-situ methods LA Giannuzzi, BW Kempshall, SM Schwarz, JK Lomness, BI Prenitzer, ... Introduction to focused ion beams: instrumentation, theory, techniques and …, 2005 | 135 | 2005 |
| Transmission electron microscope specimen preparation of Zn powders using the focused ion beam lift-out technique BI Prenitzer, LA Giannuzzi, K Newman, SR Brown, RB Irwin, FA Stevie, ... Metallurgical and Materials Transactions A 29, 2399-2406, 1998 | 107 | 1998 |
| Electron backscattering diffraction investigation of focused ion beam surfaces TL Matteson, SW Schwarz, EC Houge, BW Kempshall, LA Giannuzzi Journal of Electronic Materials 31, 33-39, 2002 | 106 | 2002 |
| Two-dimensional and 3-dimensional analysis of bone/dental implant interfaces with the use of focused ion beam and electron microscopy LA Giannuzzi, D Phifer, NJ Giannuzzi, MJ Capuano Journal of Oral and Maxillofacial Surgery 65 (4), 737-747, 2007 | 104 | 2007 |
| High resolution transmission electron microscopy study on polyacrylonitrile/carbon nanotube based carbon fibers and the effect of structure development on the thermal and … BA Newcomb, LA Giannuzzi, KM Lyons, PV Gulgunje, K Gupta, Y Liu, ... Carbon 93, 502-514, 2015 | 97 | 2015 |
| Wet thermal oxidation of GaN ED Readinger, SD Wolter, DL Waltemyer, JM Delucca, SE Mohney, ... Journal of electronic materials 28, 257-260, 1999 | 96 | 1999 |
Joseph MichaelSandia National LaboratoriesVerified email at sandia.gov
