Deep learning approaches for mining structure-property linkages in high contrast composites from simulation datasets Z Yang, YC Yabansu, R Al-Bahrani, W Liao, AN Choudhary, SR Kalidindi, ... Computational Materials Science 151, 278-287, 2018 | 302 | 2018 |
System and method for modeling, abstraction, and analysis of software F Ivancic, PN Ashar, M Ganai, A Gupta, Z Yang US Patent 7,346,486, 2008 | 291 | 2008 |
Microstructural materials design via deep adversarial learning methodology Z Yang, X Li, L Catherine Brinson, AN Choudhary, W Chen, A Agrawal Journal of Mechanical Design 140 (11), 111416, 2018 | 229 | 2018 |
Software defect prediction based on kernel PCA and weighted extreme learning machine Z Xu, J Liu, X Luo, Z Yang, Y Zhang, P Yuan, Y Tang, T Zhang Information and Software Technology 106, 182-200, 2019 | 171 | 2019 |
The impact of feature selection on defect prediction performance: An empirical comparison Z Xu, J Liu, Z Yang, G An, X Jia 2016 IEEE 27th international symposium on software reliability engineering …, 2016 | 167 | 2016 |
Efficient SAT-based bounded model checking for software verification F Ivančić, Z Yang, MK Ganai, A Gupta, P Ashar Theoretical Computer Science 404 (3), 256-274, 2008 | 163 | 2008 |
F-Soft: Software Verification Platform F Ivančić, Z Yang, MK Ganai, A Gupta, I Shlyakhter, P Ashar Computer Aided Verification: 17th International Conference, CAV 2005 …, 2005 | 156 | 2005 |
Establishing structure-property localization linkages for elastic deformation of three-dimensional high contrast composites using deep learning approaches Z Yang, YC Yabansu, D Jha, W Liao, AN Choudhary, SR Kalidindi, ... Acta Materialia 166, 335-345, 2019 | 153 | 2019 |
SAT-based image computation with application in reachability analysis A Gupta, Z Yang, P Ashar, A Gupta International Conference on Formal Methods in Computer-Aided Design, 391-408, 2000 | 142* | 2000 |
Model checking C programs using F-Soft F Ivancic, I Shlyakhter, A Gupta, MK Ganai, V Kahlon, C Wang, Z Yang 2005 International Conference on Computer Design, 297-308, 2005 | 132 | 2005 |
Generating data race witnesses by an SMT-based analysis M Said, C Wang, Z Yang, K Sakallah NASA Formal Methods Symposium, 313-327, 2011 | 113 | 2011 |
Is there a best symbolic cycle-detection algorithm? K Fisler, R Fraer, G Kamhi, MY Vardi, Z Yang International Conference on Tools and Algorithms for the Construction and …, 2001 | 112 | 2001 |
Peephole partial order reduction C Wang, Z Yang, V Kahlon, A Gupta International Conference on Tools and Algorithms for the Construction and …, 2008 | 109 | 2008 |
Iterative abstraction using SAT-based BMC with proof analysis A Gupta, M Ganai, Z Yang, P Ashar ICCAD-2003. International Conference on Computer Aided Design (IEEE Cat. No …, 2003 | 102 | 2003 |
sCompile: Critical path identification and analysis for smart contracts J Chang, B Gao, H Xiao, J Sun, Y Cai, Z Yang Formal Methods and Software Engineering: 21st International Conference on …, 2019 | 99 | 2019 |
Opportunistic networks for emergency applications and their standard implementation framework L Lilien, A Gupta, Z Yang 2007 IEEE International Performance, Computing, and Communications …, 2007 | 95 | 2007 |
Learning from BDDs in SAT-based bounded model checking A Gupta, M Ganai, C Wang, Z Yang, P Ashar Proceedings of the 40th annual Design Automation Conference, 824-829, 2003 | 77 | 2003 |
A real-time iterative machine learning approach for temperature profile prediction in additive manufacturing processes A Paul, M Mozaffar, Z Yang, W Liao, A Choudhary, J Cao, A Agrawal 2019 IEEE International Conference on Data Science and Advanced Analytics …, 2019 | 76 | 2019 |
Characterizing attacks on deep reinforcement learning X Pan, C Xiao, W He, S Yang, J Peng, M Sun, J Yi, Z Yang, M Liu, B Li, ... arXiv preprint arXiv:1907.09470, 2019 | 76 | 2019 |
What causes my test alarm? Automatic cause analysis for test alarms in system and integration testing H Jiang, X Li, Z Yang, J Xuan 2017 IEEE/ACM 39th International Conference on Software Engineering (ICSE …, 2017 | 74 | 2017 |