Get my own profile
Co-authors
Thomas M. MooreWaviks, Inc.Verified email at waviks.com
Tz-Cheng ChiuNational Cheng Kung UniversityVerified email at mail.ncku.edu.tw
Marcus KaestnerTechnische Universität IlmenauVerified email at tu-ilmenau.de
Stephen T KellyCarl Zeiss Research Microscopy SolutionsVerified email at zeiss.com
Jason FowlkesCenter for Nanophase Materials SciencesVerified email at ornl.gov
Nick RobertsAssociate Professor, Utah State UniversityVerified email at usu.edu
Christopher ParmenterSenior Research Fellow in Cryo-Electron Microscopy, University of NottinghamVerified email at nottingham.ac.uk
Michael W FayUniversity of NottinghamVerified email at nottingham.ac.uk
Brian P GormanColorado School of MinesVerified email at mines.edu
David DiercksColorado School of MinesVerified email at mines.edu
Eric StachDepartment of Materials Science and Engineering, University of PennsylvaniaVerified email at seas.upenn.edu
Norman J. SalmonHummingbird ScientificVerified email at hummingbirdscientific.com
Matt HiscockHead of Product Science, Oxford Instruments NanoAnalysisVerified email at oxinst.com
Soma Sekhar KandulaIntel CorpVerified email at intel.com
Nancy SottosUniversity of Illinois Urbana-ChampaignVerified email at illinois.edu
Philippe H. GeubelleAerospace Engineering, University of IllinoisVerified email at illinois.edu
Deepak GoyalIntel CorporationVerified email at intel.com
Dr. Sebastian BrandFraunhofer IMWSVerified email at imws.fraunhofer.de
Paul HoProfessor, University of Texas at AustinVerified email at austin.utexas.edu
Hrishikesh BaleUniversity of California, Berkeley/ Lawrence Berkeley Natl. LabVerified email at lbl.gov