Amratansh Gupta

202020212022202320241 1 4 3 6

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RAJARSHI ROY CHAUDHURIDST INSPIRE PhD Fellow, Department of Electronic Systems Engg., Indian Institute of ScienceVerified email at iisc.ac.in
Mayank ShrivastavaIndian Institute of Science BangaloreVerified email at iisc.ac.in
Rasik Rashid MalikPhD Student, IISc BangaloreVerified email at iisc.ac.in
Dr. Sayak Dutta GuptaAssistant Professor, Dept. of Electrical Engineering, IIT MadrasVerified email at ee.iitm.ac.in
Vipin JoshiAssistant Professor, BITS-Pilani Goa CampusVerified email at goa.bits-pilani.ac.in
Mohit GaneriwalaMarie Skłodowska-Curie Actions, Postdoc Fellow, Universidad de GranadaVerified email at iitgn.ac.in
Arunangshu GhoshNational Institute of Technology PatnaVerified email at nitp.ac.in
Mehak Ashraf MirPMRF, PhD scholar, Department of Electronic Systems Engg., Indian Institute of science.Verified email at iisc.ac.in
Nihar Ranjan Mohapatra

Amratansh Gupta

PhD Researcher at imec & Vrije Universiteit Brussel

Verified email at imec.be - Homepage


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Impact of Channel Electric Field Profile Evolution on Nanosecond Timescale Cyclic Stress-Induced Dynamic R_ON Behavior in AlGaN/GaN HEMTs—Part II RR Chaudhuri, A Gupta, V Joshi, RR Malik, SD Gupta, M Shrivastava IEEE Transactions on Electron Devices 70 (12), 6183-6189, 2023	4	2023
An unified charge centroid model for silicon and low effective mass III-V channel double gate MOS transistors A Gupta, M Ganeriwala, NR Mohapatra 2019 32nd International Conference on VLSI Design and 2019 18th …, 2019	4	2019
Physical Insights Into the Lattice Temperature Dependent Evolution of Hot Electron Distribution in GaN HEMTs on C-Doped GaN-on-Si RR Chaudhuri, V Joshi, RR Malik, M Shrivastava IEEE Transactions on Electron Devices, 2023	3	2023
Development of Electronic Interface for Sensing Applications with Voltammetric Electronic Tongue M Kumar, S Kumar, A Gupta, A Ghosh 2018 IEEE SENSORS, 1-4, 2018	3	2018
Unique Lattice Temperature Dependent Evolution of Hot Electron Distribution in GaN HEMTs on C-doped GaN Buffer and its Reliability Consequences RR Chaudhuri, V Joshi, A Gupta, T Joshi, RR Malik, MA Mir, SD Gupta, ... 2023 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2023	1	2023
Physical Insights Into Nano-Second Time Scale Cyclic Stress Induced Dynamic Behavior in AlGaN/GaN HEMTs—Part I RR Chaudhuri, A Gupta, V Joshi, RR Malik, SD Gupta, M Shrivastava IEEE Transactions on Electron Devices, 2023		2023

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