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Co-authors
- Kyung-Jin LeeDepartment of Physics, Korea Advanced Institute of Science and Technology (KAIST)Verified email at kaist.ac.kr
- Hyun-Woo LeeDepartment of Physics, Pohang University of Science and TechnologyVerified email at postech.ac.kr
- Mark StilesFellow, National Institute of Standards and TechnologyVerified email at nist.gov
- Byoung-Chul MinKorea Institute of Science and Technology (KIST)Verified email at kist.re.kr
- Byong Guk ParkProfessor of Materials Science and Engineering, KAISTVerified email at kaist.ac.kr
- Gyungchoon GoKAISTVerified email at kaist.ac.kr
- Jung-Hwan moonSamsung electronicsVerified email at korea.ac.kr
- Hyun Cheol KooKorea Institute of Science and TechnologyVerified email at kist.re.kr
- Jong-Ryul JeongChungnam National University, South KoreaVerified email at cnu.ac.kr
- Jisu RyuSamsung ElectronicsVerified email at samsung.com
- soo-man seoMaterials science and engineering, Korea universityVerified email at korea.ac.kr
- Jairo SinovaJohannes Gutenberg UniversitätVerified email at uni-mainz.de
- Yuriy MokrousovForschungszentrum Jülich, Johannes Gutenberg University MainzVerified email at fz-juelich.de
- Jeongwoo KimDepartment of Physics, Incheon National UniversityVerified email at inu.ac.kr
- Tae-Eon Park한국과학기술연구원Verified email at kist.re.kr
- Dong-Soo HanKorea Insititute of Science and TechnologyVerified email at kist.re.kr
- Hyeon-Jong ParkKorea universityVerified email at korea.ac.kr
- Karin Everschor-SitteUniversität Duisburg-EssenVerified email at uni-due.de
- Reinoud LavrijsenEindhoven University of TechnologyVerified email at tue.nl
- Min-Gu KangDepartment of materials, ETH ZurichVerified email at mat.ethz.ch
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