| Application of Lithium Metal Electrodes to All-Solid-State Lithium Secondary Batteries Using Li3 PO 4 Li2 S SiS2 Glass H Takahara, M Tabuchi, T Takeuchi, H Kageyama, J Ide, K Handa, ... Journal of The Electrochemical Society 151 (9), A1309, 2004 | 44 | 2004 |
| Study of the capacity fading mechanism for Fe-substituted LiCoO2 positive electrode VL McLaren, AR West, M Tabuchi, A Nakashima, H Takahara, ... Journal of The Electrochemical Society 151 (5), A672, 2004 | 39 | 2004 |
| All-solid-state lithium secondary battery using oxysulfide glass: addition and coating of carbon to positive electrode H Takahara, T Takeuchi, M Tabuchi, H Kageyama, Y Kobayashi, Y Kurisu, ... Journal of the Electrochemical Society 151 (10), A1539, 2004 | 37 | 2004 |
| Quantification of lithium in LIB electrodes with glow discharge optical emission spectroscopy (GD-OES) H Takahara, M Shikano, H Kobayashi Journal of power sources 244, 252-258, 2013 | 33 | 2013 |
| Electrochemical performance of cathodes prepared on current collector with different surface morphologies T Nakamura, S Okano, N Yaguma, Y Morinaga, H Takahara, Y Yamada Journal of power sources 244, 532-537, 2013 | 30 | 2013 |
| Depth profiling of graphite electrode in lithium ion battery using glow discharge optical emission spectroscopy with small quantities of hydrogen or oxygen addition to argon H Takahara, A Kojyo, K Kodama, T Nakamura, K Shono, Y Kobayashi, ... Journal of Analytical Atomic Spectrometry 29 (1), 95-104, 2014 | 29 | 2014 |
| Elemental distribution analysis of LiFePO4/graphite cells studied with glow discharge optical emission spectroscopy (GD-OES) H Takahara, H Miyauchi, M Tabuchi, T Nakamura Journal of the Electrochemical Society 160 (2), A272, 2012 | 24 | 2012 |
| Analysis of solid electrolyte interphase in Mn-based cathode/graphite Li-ion battery with glow discharge optical emission spectroscopy H Takahara, Y Kobayashi, K Shono, H Kobayashi, M Shikano, ... Journal of the Electrochemical Society 161 (10), A1716, 2014 | 22 | 2014 |
| Thickness and composition analysis of thin film samples using FP method by XRF analysis H Takahara Rigaku J 33, 17-21, 2017 | 20 | 2017 |
| Hydrogen analysis in diamond-like carbon by glow discharge optical emission spectroscopy H Takahara, R Ishigami, K Kodama, A Kojyo, T Nakamura, Y Oka Journal of Analytical Atomic Spectrometry 31 (4), 940-947, 2016 | 19 | 2016 |
| Method development for the analysis of poorly soluble solids by total reflection X-ray fluorescence spectrometry H Takahara, A Ohbuchi, K Murai Spectrochimica Acta Part B: Atomic Spectroscopy 149, 276-280, 2018 | 13 | 2018 |
| Nondestructive discrimination of red silk single fibers using total reflection X‐ray fluorescence spectrometry and synchrotron radiation X‐ray fluorescence spectrometry H Komatsu, H Takahara, W Matsuda, Y Nishiwaki Journal of Forensic Sciences, 2021 | 10 | 2021 |
| Method and mechanism of vapor phase treatment–total reflection X-ray fluorescence for trace element analysis on silicon wafer surface H Takahara, Y Mori, A Shimazaki, Y Gohshi Spectrochimica Acta Part B: Atomic Spectroscopy 65 (12), 1022-1028, 2010 | 10 | 2010 |
| Vapor phase treatment–total reflection X-ray fluorescence for trace elemental analysis of silicon wafer surface H Takahara, Y Mori, H Shibata, A Shimazaki, MB Shabani, M Yamagami, ... Spectrochimica Acta Part B: Atomic Spectroscopy 90, 72-82, 2013 | 9 | 2013 |
| Observation of AuCu alloying by grazing-incidence X-ray fluorescence T Yamada, H Takahara, A Ohbuchi, W Matsuda, Y Shimizu Spectrochimica Acta Part B: Atomic Spectroscopy 149, 256-260, 2018 | 6 | 2018 |
| An Evaluation of Total Reflection X-ray Fluorescence as a Tool for Forensic Discrimination of Single Polyester Fibers H Takahara, W Matsuda, Y Kusakabe, S Ikeda, M Kuraoka, H Komatsu, ... Analytical Sciences, 20P348, 2021 | 5 | 2021 |
| Trace metal analysis on hafnium silicate deposited Si wafer by Total Reflection X-ray Fluorescence H Takahara, H Murakami, T Kinashi, C Sparks Spectrochimica Acta Part B: Atomic Spectroscopy 63 (12), 1355-1358, 2008 | 5 | 2008 |
| Advanced TXRF analysis: background reduction when measuring high-k materials and mapping metallic contamination C Sparks, J Barnett, DK Michelson, C Gondran, SC Song, A Martinez, ... Solid State Phenomena 134, 285-288, 2008 | 5 | 2008 |
| Trace metallic contamination analysis on wafer edge and bevel by TXRF and VPD-TXRF H Takahara, K Tsugane Solid State Phenomena 145, 105-108, 2009 | 3 | 2009 |
| Core/shell structure analysis for Li ion secondary battery electrode LiFePO4/C by Small Angle X-ray Scattering Method H Yashiro, H Takahara, T Nakamura, R Sato JOURNAL OF THE CERAMIC SOCIETY OF JAPAN 121 (1412), S1-S5, 2013 | 1 | 2013 |
