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Ewan Towie
Ewan Towie
Synopsys ltd.
Verified email at synopsys.com - Homepage
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Cited by
Cited by
Year
Impact of precisely positioned dopants on the performance of an ultimate silicon nanowire transistor: A full three-dimensional NEGF simulation study
VP Georgiev, EA Towie, A Asenov
IEEE Transactions on Electron Devices 60 (3), 965-971, 2013
302013
Simulation study of the impact of quantum confinement on the electrostatically driven performance of n-type nanowire transistors
Y Wang, T Al-Ameri, X Wang, VP Georgiev, E Towie, SM Amoroso, ...
IEEE Transactions on Electron Devices 62 (10), 3229-3236, 2015
262015
Experimental and simulation study of silicon nanowire transistors using heavily doped channels
VP Georgiev, MM Mirza, AI Dochioiu, F Adamu-Lema, SM Amoroso, ...
IEEE Transactions on Nanotechnology 16 (5), 727-735, 2017
252017
Impact of quantum confinement on transport and the electrostatic driven performance of silicon nanowire transistors at the scaling limit
T Al-Ameri, VP Georgiev, T Sadi, Y Wang, F Adamu-Lema, X Wang, ...
Solid-State Electronics 129, 73-80, 2017
152017
Impact of strain on the performance of Si nanowires transistors at the scaling limit: A 3D Monte Carlo/2D Poisson Schrodinger simulation study
T Al-Ameri, VP Georgiev, FA Lema, T Sadi, X Wang, E Towie, C Riddet, ...
2016 International Conference on Simulation of Semiconductor Processes and …, 2016
152016
Inverse Scaling Trends for Charge-Trapping-Induced Degradation of FinFETs Performance
SM Amoroso, VP Georgiev, L Gerrer, E Towie, X Wang, C Riddet, ...
Electron Devices, IEEE Transactions on 61 (12), 4014-4018, 2014
122014
3d multi-subband ensemble Monte Carlo simulator of FinFETs and nanowire transistors
C Sampedro, L Donetti, F Gamiz, A Godoy, FJ Garcia-Ruiz, VP Georgiev, ...
2014 International Conference on Simulation of Semiconductor Processes and …, 2014
122014
Design and analysis of the In0. 53Ga0. 47As implant-free quantum-well device structure
B Benbakhti, K Kalna, KH Chan, E Towie, G Hellings, G Eneman, ...
Microelectronic engineering 88 (4), 358-361, 2011
122011
Variability-aware TCAD based design-technology co-optimization platform for 7nm node nanowire and beyond
Y Wang, B Cheng, X Wang, E Towie, C Riddet, AR Brown, SM Amoroso, ...
2016 IEEE Symposium on VLSI Technology, 1-2, 2016
92016
Predicting future technology performance
A Asenov, C Alexander, C Riddet, E Towie
Proceedings of the 50th Annual Design Automation Conference, 1-6, 2013
92013
Performance of vertically stacked horizontal Si nanowires transistors: A 3D Monte Carlo/2D Poisson Schrodinger simulation study
T Al-Ameri, VP Georgiev, FA Lema, T Sadi, E Towie, C Riddet, ...
2016 IEEE Nanotechnology Materials and Devices Conference (NMDC), 1-2, 2016
82016
One-dimensional multi-subband Monte Carlo simulation of charge transport in Si nanowire transistors
T Sadi, E Towie, M Nedjalkov, C Riddet, C Alexander, L Wang, ...
2016 International Conference on Simulation of Semiconductor Processes and …, 2016
82016
Monte Carlo analysis of In0.53Ga0.47as Implant-Free Quantum-Well device performance
B Benbakhti, E Towie, K Kalna, G Hellings, G Eneman, K De Meyer, ...
2010 Silicon Nanoelectronics Workshop, 1-2, 2010
62010
Numerical analysis of the new implant-free quantum-well CMOS: DualLogic approach
B Benbakhti, KH Chan, E Towie, K Kalna, C Riddet, X Wang, G Eneman, ...
Solid-state electronics 63 (1), 14-18, 2011
42011
Experimental and simulation study of a high current 1D silicon nanowire transistor using heavily doped channels
VP Georgiev, MM Mirza, AI Dochioiu, FA Lema, SM Amoroso, E Towie, ...
2016 IEEE Nanotechnology Materials and Devices Conference (NMDC), 1-3, 2016
32016
Impact of the statistical variability on 15nm III–V and Ge MOSFET based SRAM design
SY Liao, EA Towie, D Balaz, C Riddet, B Cheng, A Asenov
2013 14th International Conference on Ultimate Integration on Silicon (ULIS …, 2013
32013
Remotely screened electron-impurity scattering model for nanoscale MOSFETs
EA Towie, JR Watling, JR Barker
Semiconductor science and technology 26 (5), 055008, 2011
32011
Comparison of Si< 100> and< 110> crystal orientation nanowire transistor reliability using Poisson–Schrödinger and classical simulations
L Gerrer, V Georgiev, SM Amoroso, E Towie, A Asenov
Microelectronics Reliability 55 (9-10), 1307-1312, 2015
22015
Silicon-on-insulator (SOI) fin-on-oxide field effect transistors (FinFETs)
B Cheng, A Brown, E Towie, N Daval, KK Bourdelle, BY Nguyen, ...
Silicon-On-Insulator (SOI) Technology, 195-211, 2014
22014
Interactions Between Precisely Placed Dopants and Interface Roughness in Silicon Nanowire Transistors: Full 3-D NEGF Simulation Study
VP Georgiev, EA Towie, A Asenov
Simulation of Semiconductor Processes and Devices (SISPAD), 2013 …, 2013
22013
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